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Your search returned 13 records. Click on the hyperlinks to view further details of Titles.. |
Magazine Name : Ieee Design And Test Of Computers
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Year : 1999 Volume number : 16 Issue: 03 |
Testing Methodology For Firewire.
(Article)
Subject:
Design & Test Of Computers
,
To Achive Cost-Effective
Author:
Lee
Melatti
Barry
Blancha
page:
102
-
111
System-On-Chip Design:Impact On Education And Research.
(Article)
Subject:
Design & Test Of Computers
,
System On Chip
Author:
Hugo
De Man
page:
11
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19
Deep Submicron Cmos Current Ic Testing: Is There A Future?
(Article)
Subject:
Design & Test Of Computers
,
Deep Submicron Cmos
Author:
Charls
F.Hawkins
Jerry
M.Soden
page:
14
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15
Guest Editors' Introduction:Test And The Product Life Cycle.
(Article)
Subject:
Design & Test Of Computers
,
Guest Editors' Introduction
Author:
Tony
Ambler
Ben
Bennetts
page:
20
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22
Design For Test And Time To Market: A Personal Perspective.
(Article)
Subject:
Design & Test Of Computers
,
Design For Test
Author:
Jon
Turino
page:
23
-
27
Board Test And The Product Life Cycle: Get Wise To Board Test Strategies.
(Article)
Subject:
Design & Test Of Computers
,
To Understand The Challenges
Author:
Bernard
Sutton
page:
28
-
33
Boundary Scan: The Internet Of Test.
(Article)
Subject:
Design & Test Of Computers
,
Once We Incorporate
Author:
Mike
Wondolowski
Ben
Bennetts
page:
34
-
43
Automating Pbx System Testing.
(Article)
Subject:
Design & Test Of Computers
,
Automating Pbx
Author:
Bertram
Weber
page:
44
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52
Generating Functional Design Verification Tests.
(Article)
Subject:
Design & Test Of Computers
,
Ford Engineers Successfully
Author:
Susana
Stoica
page:
53
-
63
Test And Reliability: Partners In Ic Manufacturing, Part 1.
(Article)
Subject:
Design & Test Of Computers
,
Discusses The Dominant Metal-
Author:
Charls
F.Hawkins
Jaume
Segura
page:
64
-
71
Unveiling The Iscas-85 Benchmarks: A Case Study In Reverse Engineering.
(Article)
Subject:
Design & Test Of Computers
,
The Lack Of Usable High-Level
Author:
Mark
C.Hancen
Hakan
Yalcin
John
P.Hayes
page:
72
-
80
Economic Online Self-Test In The Time-Triggered Architecture.
(Article)
Subject:
Design & Test Of Computers
,
The Properties Of This Time-Driven
Author:
Andreas
Steininger
Christopher
Temple
page:
81
-
89
Fault-Secure Parity Prediction Booth Multipliers.
(Article)
Subject:
Design & Test Of Computers
,
Hardware Efficiency
Author:
Michael
Nicolaidis
Ricardo
O.Duarte
page:
90
-
101
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